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1 Publikation


2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla, Abhay Rammurti u. a.: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, in: Microelectronics Reliability 150 (2023).
ELSA | DOI | WoS
 

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Zitationsstil: Universität Freiburg

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