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1 Publikation


2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, Microelectronics Reliability. 150 (2023).
ELSA | DOI | WoS
 

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Zitationsstil: Elsevier Havard

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