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1 Publikation
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” Microelectronics Reliability 150 (2023). https://doi.org/10.1016/j.microrel.2023.115216.
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