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1 Publikation
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla, A. R., Martin, R., Probst, R., & Song, J. (2023). Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability, 150, Article 115216. https://doi.org/10.1016/j.microrel.2023.115216
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