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1 Publikation
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla, Abhay Rammurti ; Martin, Robert ; Probst, Roman ; Song, Jian: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. In: Microelectronics Reliability Bd. 150. Amsterdam, Elsevier (2023)
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