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1 Publikation
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability. 2023;150. doi:10.1016/j.microrel.2023.115216
ELSA
| DOI
| WoS