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4 Publikationen


2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla, Abhay Rammurti u. a.: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, in: Microelectronics Reliability 150 (2023).
ELSA | DOI | WoS
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger, Kevin/Yuan, Haomiao/Song, Jian: The influence of the vibration test mode on the failure rate of electrical connectors, in: Microelectronics reliability : an internat. journal & world abstracting service 135 (2022), H. 8.
ELSA | DOI
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, Jian/Shukla, Abhay Rammurti/Probst, Roman: Prediction of failure in time (FIT) of electrical connectors with short term tests, in: Microelectronics reliability : an internat. journal & world abstracting service 138 (2022), H. November 2022.
ELSA | DOI
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin/Song, Jian: The influence of thermal cycling test parameters on the failure rate of electrical connectors, in: Microelectronics reliability : an internat. journal & world abstracting service 138 (2022), H. November 2022.
ELSA | DOI
 

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Zitationsstil: Universität Freiburg

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