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4 Publikationen
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” Microelectronics Reliability, vol. 150, 115216, 2023, https://doi.org/10.1016/j.microrel.2023.115216.
ELSA
| DOI
| WoS
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger, Kevin, et al. “The Influence of the Vibration Test Mode on the Failure Rate of Electrical Connectors.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service, vol. 135, no. 8, 114567, 2022, https://doi.org/10.1016/j.microrel.2022.114567.
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, Jian, et al. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service, vol. 138, no. November 2022, 114684, 2022, https://doi.org/10.1016/j.microrel.2022.114684.
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin, and Jian Song. “The Influence of Thermal Cycling Test Parameters on the Failure Rate of Electrical Connectors.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service, vol. 138, no. November 2022, 114633, 2022, https://doi.org/10.1016/j.microrel.2022.114633.
ELSA
| DOI