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4 Publikationen


2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests,” Microelectronics Reliability, vol. 150, Art. no. 115216, 2023, doi: 10.1016/j.microrel.2023.115216.
ELSA | DOI | WoS
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
K. Krüger, H. Yuan, and J. Song, “The influence of the vibration test mode on the failure rate of electrical connectors,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 135, no. 8, Art. no. 114567, 2022, doi: https://doi.org/10.1016/j.microrel.2022.114567.
ELSA | DOI
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
J. Song, A. R. Shukla, and R. Probst, “Prediction of failure in time (FIT) of electrical connectors with short term tests,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 138, no. November 2022, Art. no. 114684, 2022, doi: 10.1016/j.microrel.2022.114684.
ELSA | DOI
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
K. Krüger and J. Song, “The influence of thermal cycling test parameters on the failure rate of electrical connectors,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 138, no. November 2022, Art. no. 114633, 2022, doi: https://doi.org/10.1016/j.microrel.2022.114633.
ELSA | DOI
 

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