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4 Publikationen


2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, Microelectronics Reliability. 150 (2023).
ELSA | DOI | WoS
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
K. Krüger, H. Yuan, J. Song, The influence of the vibration test mode on the failure rate of electrical connectors, Microelectronics Reliability : An Internat. Journal & World Abstracting Service. 135 (2022).
ELSA | DOI
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
J. Song, A.R. Shukla, R. Probst, Prediction of failure in time (FIT) of electrical connectors with short term tests, Microelectronics Reliability : An Internat. Journal & World Abstracting Service. 138 (2022).
ELSA | DOI
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
K. Krüger, J. Song, The influence of thermal cycling test parameters on the failure rate of electrical connectors, Microelectronics Reliability : An Internat. Journal & World Abstracting Service. 138 (2022).
ELSA | DOI
 

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