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4 Publikationen
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla, Abhay Rammurti ; Martin, Robert ; Probst, Roman ; Song, Jian: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. In: Microelectronics Reliability Bd. 150. Amsterdam, Elsevier (2023)
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2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger, Kevin ; Yuan, Haomiao ; Song, Jian: The influence of the vibration test mode on the failure rate of electrical connectors. In: Microelectronics reliability : an internat. journal & world abstracting service Bd. 135. Amsterdam, Elsevier (2022), Nr. 8
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2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, Jian ; Shukla, Abhay Rammurti ; Probst, Roman: Prediction of failure in time (FIT) of electrical connectors with short term tests. In: Microelectronics reliability : an internat. journal & world abstracting service Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022
ELSA
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2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin ; Song, Jian: The influence of thermal cycling test parameters on the failure rate of electrical connectors. In: Microelectronics reliability : an internat. journal & world abstracting service Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022
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