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4 Publikationen
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” Microelectronics Reliability 150 (2023). https://doi.org/10.1016/j.microrel.2023.115216.
ELSA
| DOI
| WoS
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger, Kevin, Haomiao Yuan, and Jian Song. “The Influence of the Vibration Test Mode on the Failure Rate of Electrical Connectors.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service 135, no. 8 (2022). https://doi.org/10.1016/j.microrel.2022.114567.
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138, no. November 2022 (2022). https://doi.org/10.1016/j.microrel.2022.114684.
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin, and Jian Song. “The Influence of Thermal Cycling Test Parameters on the Failure Rate of Electrical Connectors.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138, no. November 2022 (2022). https://doi.org/10.1016/j.microrel.2022.114633.
ELSA
| DOI