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4 Publikationen


2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla AR et al. (2023) Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests. Microelectronics Reliability 150.
ELSA | DOI | WoS
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger K, Yuan H and Song J (2022) The Influence of the Vibration Test Mode on the Failure Rate of Electrical Connectors. Microelectronics reliability : an internat. journal & world abstracting service 135.
ELSA | DOI
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song J, Shukla AR and Probst R (2022) Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests. Microelectronics reliability : an internat. journal & world abstracting service 138.
ELSA | DOI
 

2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger K and Song J (2022) The Influence of Thermal Cycling Test Parameters on the Failure Rate of Electrical Connectors. Microelectronics reliability : an internat. journal & world abstracting service 138.
ELSA | DOI
 

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