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4 Publikationen
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla, A. R., Martin, R., Probst, R., & Song, J. (2023). Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability, 150, Article 115216. https://doi.org/10.1016/j.microrel.2023.115216
ELSA
| DOI
| WoS
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger, K., Yuan, H., & Song, J. (2022). The influence of the vibration test mode on the failure rate of electrical connectors. Microelectronics Reliability : An Internat. Journal & World Abstracting Service, 135(8), Article 114567. https://doi.org/10.1016/j.microrel.2022.114567
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, J., Shukla, A. R., & Probst, R. (2022). Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics Reliability : An Internat. Journal & World Abstracting Service, 138(November 2022), Article 114684. https://doi.org/10.1016/j.microrel.2022.114684
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, K., & Song, J. (2022). The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics Reliability : An Internat. Journal & World Abstracting Service, 138(November 2022), Article 114633. https://doi.org/10.1016/j.microrel.2022.114633
ELSA
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