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4 Publikationen
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability. 2023;150. doi:10.1016/j.microrel.2023.115216
ELSA
| DOI
| WoS
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger K, Yuan H, Song J. The influence of the vibration test mode on the failure rate of electrical connectors. Microelectronics reliability : an internat journal & world abstracting service. 2022;135(8). doi:https://doi.org/10.1016/j.microrel.2022.114567
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics reliability : an internat journal & world abstracting service. 2022;138(November 2022). doi:10.1016/j.microrel.2022.114684
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger K, Song J. The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics reliability : an internat journal & world abstracting service. 2022;138(November 2022). doi:https://doi.org/10.1016/j.microrel.2022.114633
ELSA
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