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4 Publikationen
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests
A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability 150 (2023).
ELSA
| DOI
A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability 150 (2023).
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
The influence of the vibration test mode on the failure rate of electrical connectors
K. Krüger, H. Yuan, J. Song, Microelectronics Reliability : An Internat. Journal & World Abstracting Service 135 (2022).
ELSA
| DOI
K. Krüger, H. Yuan, J. Song, Microelectronics Reliability : An Internat. Journal & World Abstracting Service 135 (2022).
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Prediction of failure in time (FIT) of electrical connectors with short term tests
J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138 (2022).
ELSA
| DOI
J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138 (2022).
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
The influence of thermal cycling test parameters on the failure rate of electrical connectors
K. Krüger, J. Song, Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138 (2022).
ELSA
| DOI
K. Krüger, J. Song, Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138 (2022).