{"status":"public","author":[{"full_name":"Funk, Mark","id":"52473","first_name":"Mark","last_name":"Funk"},{"id":"1706","full_name":"Gillich, Eugen","last_name":"Gillich","first_name":"Eugen"},{"full_name":"Türke, Thomas","last_name":"Türke","first_name":"Thomas"},{"id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker"}],"citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Funk, Mark</span> ; <span style=\"font-variant:small-caps;\">Gillich, Eugen</span> ; <span style=\"font-variant:small-caps;\">Türke, Thomas</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: Intaglio Quality Measurement. In: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA , 2016","ama":"Funk M, Gillich E, Türke T, Lohweg V. Intaglio Quality Measurement. In: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA ; 2016.","van":"Funk M, Gillich E, Türke T, Lohweg V. Intaglio Quality Measurement. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA ; 2016.","chicago-de":"Funk, Mark, Eugen Gillich, Thomas Türke und Volker Lohweg. 2016. Intaglio Quality Measurement. In: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA .","havard":"M. Funk, E. Gillich, T. Türke, V. Lohweg, Intaglio Quality Measurement, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA , 2016.","ufg":"<b>Funk, Mark et. al. (2016)</b>: Intaglio Quality Measurement, in: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>, San Francisco, CA, USA .","bjps":"<b>Funk M <i>et al.</i></b> (2016) Intaglio Quality Measurement. <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA .","apa":"Funk, M., Gillich, E., Türke, T., &#38; Lohweg, V. (2016). Intaglio Quality Measurement. In <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA .","short":"M. Funk, E. Gillich, T. Türke, V. Lohweg, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA , 2016.","chicago":"Funk, Mark, Eugen Gillich, Thomas Türke, and Volker Lohweg. “Intaglio Quality Measurement.” In <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA , 2016.","mla":"Funk, Mark, et al. “Intaglio Quality Measurement.” <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>, 2016.","ieee":"M. Funk, E. Gillich, T. Türke, and V. Lohweg, “Intaglio Quality Measurement,” in <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>, 2016."},"type":"conference","place":"San Francisco, CA, USA ","department":[{"_id":"DEP5023"}],"language":[{"iso":"eng"}],"title":"Intaglio Quality Measurement","date_updated":"2023-03-15T13:49:38Z","date_created":"2019-11-26T14:43:19Z","user_id":"74004","_id":"2039","year":2016,"abstract":[{"text":"In this paper an advanced approach for Intaglio quality control is presented.  In the first step, the essential informationabout the printing process, research objects and measurement setup is provided.  Following, the mathematical approachbased on image processing methods is described which imitates the printers manner to examine the optical characteristicsof Intaglio prints.  The main focus is the early recognition of tending quality deviations to be able to support the printerthrough recommendations on readjustments of the machine settings.  Therefore, specific key values are generated whichdescribe the prints overall quality, regarding its optical characteristics and the occurrence of printing flaws.  The resultsshown at the end encourage extended developments.","lang":"eng"}],"publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection V"}