{"status":"public","author":[{"first_name":"Abhay Rammurti","last_name":"Shukla","id":"74188","full_name":"Shukla, Abhay Rammurti"},{"full_name":"Martin, Robert","first_name":"Robert","last_name":"Martin"},{"first_name":"Roman","last_name":"Probst","full_name":"Probst, Roman","id":"69156"},{"id":"5297","full_name":"Song, Jian","first_name":"Jian","last_name":"Song"}],"user_id":"83781","title":"Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests","citation":{"chicago-de":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023. <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>.","ufg":"<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, o. O. 2023.","bjps":"<b>Shukla AR <i>et al.</i></b> (2023) <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>. .","ama":"Shukla AR, Martin R, Probst R, Song J. <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>.; 2023.","van":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. 2023.","chicago":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>, 2023.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Martin, Robert</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>, 2023","short":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests, 2023.","mla":"Shukla, Abhay Rammurti, et al. <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>. 2023.","ieee":"A. R. Shukla, R. Martin, R. Probst, and J. Song, <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>. 2023.","havard":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, 2023.","apa":"Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>. 34rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Toulouse (France)."},"language":[{"iso":"eng"}],"_id":"11361","publication_status":"published","date_updated":"2024-05-17T14:07:26Z","date_created":"2024-04-18T10:18:33Z","year":"2023","type":"conference_speech","conference":{"end_date":"2023-10-05","location":"Toulouse (France)","name":"34rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)","start_date":"2023-10-02"}}