{"publication_identifier":{"eisbn":["979‐8‐3503‐4246‐8","979‐8‐3503‐4245‐1 "],"issn":["2158‐9992"],"isbn":["979‐8‐3503‐4244‐4"]},"conference":{"name":"68th Holm Conference on Electrical Contacts (HOLM)","location":"Seattle","start_date":"2023-10-04","end_date":"2023-10-11"},"publication":"2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)","publication_status":"published","abstract":[{"text":"The state of health and lifetime estimation process of electrical connectors via lifetime tests is a time and labor intensive process. In our previous work, a correlation between the contact resistance developments in the early stages of lifetime tests of electrical connectors with the final results was established using a data driven statistical process based on probability distribution. Also, state of health indicators for prognosis of lifetime were introduced. In this work, the state of health indicators have been optimized. The sensitivity analysis is performed with regards to the selection of the appropriate amount of test data based on test duration for the reliable prognosis of the state of health and the characteristic lifetime. Through this the possibility of further reduction of test duration required for the reliable prognosis of state of health is investigated. Based on the results of analysis, a guideline for the determination of the duration of lifetime tests which lead to a reliable prediction of lifetime of connectors can be provided. Also, an assessment of the state of art in the prognosis of the lifetime of electrical connectors has been presented.","lang":"eng"}],"year":"2023","_id":"11360","date_updated":"2024-05-17T14:12:04Z","user_id":"83781","date_created":"2024-04-18T10:11:50Z","title":"Advances in Evaluation of State of Health of Electrical Connectors","language":[{"iso":"eng"}],"publisher":"IEEE","type":"conference_editor_article","citation":{"chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2023. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. IEEE. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>, .","ama":"Song J, Shukla AR, Probst R. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>Advances in Evaluation of State of Health of Electrical Connectors</i> : IEEE, 2023","van":"Song J, Shukla AR, Probst R. Advances in Evaluation of State of Health of Electrical Connectors. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM). IEEE; 2023.","mla":"Song, Jian, et al. “Advances in Evaluation of State of Health of Electrical Connectors.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>, IEEE, 2023, <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>.","ieee":"J. Song, A. R. Shukla, and R. Probst, <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. IEEE, 2023. doi: <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>.","havard":"J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health of Electrical Connectors, IEEE, 2023.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2023) <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. IEEE.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2023). Advances in Evaluation of State of Health of Electrical Connectors. In <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. 68th Holm Conference on Electrical Contacts (HOLM), Seattle. IEEE. <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Advances in Evaluation of State of Health of Electrical Connectors, o. O. 2023.","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>.","short":"J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health of Electrical Connectors, IEEE, 2023."},"doi":"10.1109/holm56075.2023.10352279","author":[{"full_name":"Song, Jian","id":"5297","first_name":"Jian","last_name":"Song"},{"id":"74188","full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","first_name":"Abhay Rammurti"},{"full_name":"Probst, Roman","id":"69156","first_name":"Roman","last_name":"Probst"}],"status":"public"}